How to Determine Crystallite Size, FWHM, and Crystal Structure from XRD Data
How to Determine Crystallite Size, FWHM, and Crystal Structure from XRD Data X-ray Diffraction (XRD) is a powerful analytical technique used to determine the crystallographic structure, chemical composition, and physical properties of materials. One of its most important applications is the characterization of crystallite size, Full Width at Half Maximum (FWHM), and crystal structure of […]
XRD Material Characterization and Analysis: An In-Depth Guide
X-ray diffraction (XRD) is a powerful and widely used technique in materials science for characterizing the structural properties of materials at the atomic or molecular level. It provides detailed information about the crystal structure, phase identification, texture, and other material properties. XRD works by directing X-rays at a material and measuring the diffraction pattern produced […]
